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Bit error rate analysis of Gaussian, annular Gaussian, cos Gaussian, and cosh Gaussian beams with the help of random phase screens

dc.authorscopusid 35614168400
dc.contributor.author Eyyuboglu, Halil T.
dc.contributor.authorID 7688 tr_TR
dc.contributor.other Elektronik ve Haberleşme Mühendisliği
dc.date.accessioned 2017-03-02T11:00:02Z
dc.date.available 2017-03-02T11:00:02Z
dc.date.issued 2014
dc.department Çankaya University en_US
dc.department-temp Cankaya Univ, Elect & Commun Dept, TR-06810 Ankara, Turkey en_US
dc.description.abstract Using the random phase screen approach, we carry out a simulation analysis of the probability of error performance of Gaussian, annular Gaussian, cos Gaussian, and cosh Gaussian beams. In our scenario, these beams are intensity-modulated by the randomly generated binary symbols of an electrical message signal and then launched from the transmitter plane in equal powers. They propagate through a turbulent atmosphere modeled by a series of random phase screens. Upon arriving at the receiver plane, detection is performed in a circuitry consisting of a pin photodiode and a matched filter. The symbols detected are compared with the transmitted ones, errors are counted, and from there the probability of error is evaluated numerically. Within the range of source and propagation parameters tested, the lowest probability of error is obtained for the annular Gaussian beam. Our investigation reveals that there is hardly any difference between the aperture-averaged scintillations of the beams used, and the distinctive advantage of the annular Gaussian beam lies in the fact that the receiver aperture captures the maximum amount of power when this particular beam is launched from the transmitter plane. (C) 2014 Optical Society of America en_US
dc.description.publishedMonth 6
dc.description.woscitationindex Science Citation Index Expanded
dc.identifier.citation Eyyuboğlu, H.T. (2014). Bit error rate analysis of Gaussian, annular Gaussian, cos Gaussian, and cosh Gaussian beams with the help of random phase screens. Applied Optics, 53(17), 3758-3763. http://dx.doi.org/10.1364/AO.53.003758 en_US
dc.identifier.doi 10.1364/AO.53.003758
dc.identifier.endpage 3763 en_US
dc.identifier.issn 1559-128X
dc.identifier.issn 2155-3165
dc.identifier.issue 17 en_US
dc.identifier.pmid 24921142
dc.identifier.scopus 2-s2.0-84942364134
dc.identifier.scopusquality Q2
dc.identifier.startpage 3758 en_US
dc.identifier.uri https://doi.org/10.1364/AO.53.003758
dc.identifier.volume 53 en_US
dc.identifier.wos WOS:000338341600024
dc.identifier.wosquality Q3
dc.institutionauthor Eyyuboğlu, Halil Tanyer
dc.language.iso en en_US
dc.publisher Optical Soc Amer en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 11
dc.title Bit error rate analysis of Gaussian, annular Gaussian, cos Gaussian, and cosh Gaussian beams with the help of random phase screens tr_TR
dc.title Bit Error Rate Analysis of Gaussian, Annular Gaussian, Cos Gaussian, and Cosh Gaussian Beams With the Help of Random Phase Screens en_US
dc.type Article en_US
dc.wos.citedbyCount 10
dspace.entity.type Publication
relation.isAuthorOfPublication 71977731-6d7b-42a5-81b1-f2681bf655b6
relation.isAuthorOfPublication.latestForDiscovery 71977731-6d7b-42a5-81b1-f2681bf655b6
relation.isOrgUnitOfPublication 3f3f4ac0-1357-4a67-a7c4-465451ea38db
relation.isOrgUnitOfPublication.latestForDiscovery 3f3f4ac0-1357-4a67-a7c4-465451ea38db

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