Browsing by Author "Guler, I"

Now showing 1 - 5 of 5

Citation - WoS: 5
Citation - Scopus: 5
Growth and Temperature Tuned Band Gap Characteristics of Nabi(Moo4)2 Single Crystal
(Iop Publishing Ltd, 2023) Isik, M.; Guler, I; Gasanly, N. M.; 101531; 09.01. Ortak Dersler Bölümü; 09. Rektörlük; 01. Çankaya Üniversitesi
Structural and optical properties of double sodium-bismuth molybdate NaBi(MoO4)(2) semiconductor compound was investigated by x-ray diffraction, Raman and transmission experiments. From the x-ray diffraction experiments, the crystal that has tetragonal structure was obtained. Vibrational modes of the crystal were found from the Raman experiments. Transmission experiments were performed in the temperature range of 10-300 K. Derivative spectroscopy analysis and absorption spectrum analysis were performed to get information about the change in band gap energy of the crystal with temperature. It was observed that the band gap energies of the crystal at different temperatures obtained from these techniques are well consisted with each other. By the help of absorption spectrum which was obtained from transmission measurements performed at varying temperatures, absolute zero value of the band gap and average phonon energy as 3.03 +/- 0.02 eV and Eph = 24 +/- 0.2 meV, respectively. Moreover, based on absorption spectrum analysis the Urbach energy of the crystal was obtained as 0.10 eV.
Citation - WoS: 51
Citation - Scopus: 55
Optical and Structural Characterization of Silicon Nitride Thin Films Deposited by Pecvd
(Elsevier, 2019) Guler, I; 101531; 09.01. Ortak Dersler Bölümü; 09. Rektörlük; 01. Çankaya Üniversitesi
Plasma enhanced chemical vapor deposition (PECVD) technique was used to deposit silicon nitride (SiNx) thin films. The silane (SiH4) and ammonia (NH3) were used as reactant gases. Both the flow rates of the NH3 and SiH4 gases were changed but total flow rate kept constant to obtain the different ratio nitrogen (N) in the SiNx films. Fourier transform infrared spectroscopy (FTIR) was used to get information about absorption ratios of the films and the bond types in the films. The refractive index of the films was obtained from ellipsometry measurements. From FTIR measurements and ellipsometry measurements, refractive index for amorphous silicon (Si) and refractive index for stoichiometric SiNx were found as 3.27 and 1.91, respectively. The photoluminescence (PL) measurements were used to see the luminescent of the amorphous Si nanoparticles which were occurred spontaneously during deposition process. High resolution transmission electron microscopy (HRTEM) was used to analyze the Si nanoparticle size.
Citation - WoS: 4
Citation - Scopus: 6
Structural and Optical Properties of Thermally Annealed Thallium Indium Disulfide Thin Films
(Elsevier Science Sa, 2020) Gasanly, N.; Guler, I; 101531; 09.01. Ortak Dersler Bölümü; 09. Rektörlük; 01. Çankaya Üniversitesi
Structural and optical properties of thallium indium disulfide (TlInS2) thin films, deposited by thermal evaporation technique and thermally annealed at different temperatures, were analyzed. Crystallite size, dislocation density and lattice strain of the thin films were found from X-ray diffraction experiments. The atomic compositions of the films were determined from energy dispersive spectroscopy analysis. Surface morphology of the films was analyzed using atomic force microscopy. From room temperature transmittance spectrum, the band gap energies of the films were identified. The decrease in band gap energies of the films with the annealing temperature up to 300 degrees C was observed due to increase in crystallite size and decrease in lattice strain. From Raman measurements, it was observed that the Raman shifts of the films were well correlated with those of TlInS2 bulk crystal.
Citation - WoS: 2
Citation - Scopus: 2
Thermoluminescence Characterization of (Ga2se3)0.25 - (Ga2s3)0.75 Single Crystal Compounds
(Elsevier Sci Ltd, 2020) Guler, I; Gasanly, N. M.; Isik, M.; 101531; 09.01. Ortak Dersler Bölümü; 09. Rektörlük; 01. Çankaya Üniversitesi
Ga2Se3 and Ga2S3 compounds take attention due to their potential applications in photovoltaics. Defects and impurities may affect the quality of optoelectronic devices. Therefore, it is worthwhile to determine the parameters (activation energy, order of kinetics, frequency factor) of traps associated with the defects and/or impurities. The aim of the present paper is to investigate the trapping parameters of (Ga2Se3)(0.25) - (Ga2S3)(0.75) single crystal which is one of the member of (Ga2Se3)(x) - (Ga2S3)(1-x) mixed crystals. For this purpose, thermoluminescence (TL) experiments were performed on (Ga2Se3)(0.25) - (Ga2S3)(0.75) single crystals in the 10-300 K region. TL spectra were also recorded using various heating rates in between 0.2 and 1.0 K/s and stopping temperatures from 30 to 60 K to get the detailed information about the characteristics of the trapping parameters. TL glow curves exhibited the overlapped peaks. The stopping temperature experimental data indicated that traps present quasi-continuous distribution within the band gap. Initial rise method analyses were applied to get the activation energies of quasi-continuously distributed revealed traps. Thermal activation energies of distributed traps were found as increasing from 108 to 246 meV as stopping temperature was increased from 30 to 60 K. The structural characteristics (lattice constants and atomic compositions of constituent elements) of used compound were also reported in the present study.
Citation - WoS: 8
Citation - Scopus: 8
Thermoluminescence in Gallium Sesquisulfide Single Crystals: Usual and Unusual Heating Rate Dependencies
(Elsevier Gmbh, 2018) Isik, M.; Gasanova, L.; Mahammadov, A.; Gasanly, N.; Guler, I; 101531; 09.01. Ortak Dersler Bölümü; 09. Rektörlük; 01. Çankaya Üniversitesi
Thermoluminescence (TL) experiments were conducted for Ga2S3 crystals to obtain information about trapping parameters. TL measurements were performed from 10 to 300 K with varying heating rates in the range of 0.2-0.8 K/s. Two TL glow peaks centered at 44K (peak A) and 91 K (peak B) were observed at heating rate of beta=0.5 K/s. For peak A, TL intensity decreased whereas that for peak B increased with elevating the heating rates that means anomalous heating rate occurred for peak B. TL glow curves were analyzed using initial rise method to find activation energies of traps. Distribution of trap centers was investigated using T-max - T-stop method. Quasi-continuous distributions with increasing activation energies from 40 to 135 meV and 193 to 460 meV were attributed to trap centers A and B, respectively. (C) 2018 Elsevier GmbH. All rights reserved.