Dielectric Response of Different Complex Materials
| dc.contributor.author | Zhang, Wei | |
| dc.contributor.author | Baleanu, Dumitru | |
| dc.contributor.author | Nigmatullin, Raoul R. | |
| dc.date.accessioned | 2017-03-13T11:25:13Z | |
| dc.date.accessioned | 2025-09-18T13:27:53Z | |
| dc.date.available | 2017-03-13T11:25:13Z | |
| dc.date.available | 2025-09-18T13:27:53Z | |
| dc.date.issued | 2012 | |
| dc.description.abstract | In this paper we describe novel results of the application of the non-orthogonal amplitude-frequency analysis of the smoothed signals (NAFASS) approach [1] for the analysis of the dielectric response of some complex materials. Our goal is to convince experimentalists that the NAFASS approach can serve as a useful tool in the cases when an underlying physical model is absent or in cases when it is necessary to calibrate the equipment with uncertain quantitative characteristics. The parameters obtained in the frame of the NAFASS approach can be used as metrological parameters for comparison of electromagnetic responses associated with properties of different dielectric materials. | en_US |
| dc.description.sponsorship | Natural Science Fund of China [10872079]; Scientific Planning Fund of Guangdong [2010B050900016] | en_US |
| dc.description.sponsorship | One of us (RRN) expresses his sincere acknowledgements to Dr. James Baker-Jarvis and Mr. Sung Kim from the National Institute of Standards and Technology, (Boulder, CO 80305, USA) for possibility to treat and analyze these interesting data in the frame of new method. Besides, the useful comments and remarks of Dr. J. Baker-Jarvis as a leading specialist of the NIST in metrology were very useful in correct formulation of the problem that was considered in the frame of new NAFASS approach. The work of this paper is partly supported by the Natural Science Fund of China (No. 10872079), Scientific Planning Fund of Guangdong (No. 2010B050900016) and was realized in the frame of the scientific research that was accepted by Kazan Federal university for 2012 year "Dielectric spectroscopy and kinetics of complex systems". | en_US |
| dc.identifier.citation | Nigmatullin, R.R., Zhang, W., Baleanu, D. (2012). Dielectric response of different complex materials. IEEE Transactions On Dielectrics And Electrical Insulation, 19(4), 1344-1350. | en_US |
| dc.identifier.doi | 10.1109/TDEI.2012.6260010 | |
| dc.identifier.issn | 1070-9878 | |
| dc.identifier.scopus | 2-s2.0-84864951985 | |
| dc.identifier.uri | https://doi.org/10.1109/TDEI.2012.6260010 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12416/13067 | |
| dc.language.iso | en | en_US |
| dc.publisher | Ieee-inst Electrical Electronics Engineers inc | en_US |
| dc.relation.ispartof | IEEE Transactions on Dielectrics and Electrical Insulation | |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | Dielectric Materials | en_US |
| dc.subject | Dielectric Measurements | en_US |
| dc.subject | Methods Of Sn Analysis | en_US |
| dc.title | Dielectric Response of Different Complex Materials | en_US |
| dc.title | Dielectric response of different complex materials | tr_TR |
| dc.type | Article | en_US |
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| gdc.author.wosid | Baleanu, Dumitru/B-9936-2012 | |
| gdc.author.wosid | Nigmatullin, Raoul/Aao-5504-2020 | |
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| gdc.description.department | Çankaya University | en_US |
| gdc.description.departmenttemp | [Nigmatullin, Raoul R.] Kazan Volga Reg Fed Univ, Inst Phys, Kazan 420008, Tatarstan, Russia; [Zhang, Wei] Jinan Univ, Coll Informat Sci & Technol, JNU KFU Joint Lab Informat Technol & Fractal Proc, Dept Elect Engn, Guangzhou, Guangdong, Peoples R China; [Baleanu, Dumitru] Cankaya Univ, Fac Arts & Sci, Dept Math & Comp Sci, TR-06530 Ankara, Turkey; [Baleanu, Dumitru] Inst Space Sci, Magurele, Romania | en_US |
| gdc.description.endpage | 1350 | en_US |
| gdc.description.issue | 4 | en_US |
| gdc.description.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
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| gdc.description.startpage | 1344 | en_US |
| gdc.description.volume | 19 | en_US |
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| gdc.oaire.keywords | Dielectric materials | |
| gdc.oaire.keywords | dielectric measurements | |
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