Millimeter-Wave Sar Imaging for Sub-Millimeter Defect Detection With Non-Destructive Testing

Abstract

This paper introduces a high-resolution 77-81 GHz mmWave Synthetic Aperture Radar (SAR) imaging methodology integrating low-cost hardware with modified radar signal characteristics specifically for NDT applications. The system is optimized to detect minimal defects in materials, including low-reflectivity ones. In contrast to the existing studies, by optimizing key system parameters, including frequency slope, sampling interval, and scanning aperture, high-resolution SAR images are achieved with reduced computational complexity and storage requirements. The experiments demonstrate the effectiveness of the system in detecting optically undetectable minimal surface defects down to 0.4 mm, such as bonded adhesive lines on low-reflectivity materials with 2500 measurement points and sub-millimeter features on metallic targets at a distance of 30 cm. The results show that the proposed system achieves comparable or superior image quality to existing high-cost setups while requiring fewer data points and simpler signal processing. Low-cost, low-complexity, and easy-to-build mmWave SAR imaging is constructed for high-resolution SAR imagery of targets with a focus on detecting defects in low-reflectivity materials. This approach has significant potential for practical NDT applications with a unique emphasis on scalability, cost-effectiveness, and enhanced performance on low-reflectivity materials for industries such as manufacturing, civil engineering, and 3D printing.