Dynamical analysis of sputtering at threshold energy range: Modelling of Ar+Ni(100) collision system
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Date
2008
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IOP Publishing Ltd
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Abstract
The sputtering process of Ar+Ni(100) collision systems is investigated by means of constant energy molecular dynamics simulations. The Ni(100) slab is mimicked by an embedded-atom potential, and the interaction between the projectile and the surface is modelled by using the reparametrized ZBL potential. Ni atom emission from the lattice is analysed over the range of 20-50 eV collision energy. Sputtering yield, angular and energy distributions of the scattered Ar and of the sputtered Ni atoms are calculated, and compared to the available theoretical and experimental data
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Surface, Yield
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Citation
Hundur, Y., Güvenç, Z.B., Hippler, R. (2008). Dynamical analysis of sputtering at threshold energy range: Modelling of Ar+Ni(100) collision system. Chinese Physics Letters, 25(2), 730-733.
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Source
Chinese Physics Letters
Volume
25
Issue
2
Start Page
730
End Page
733